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Exam Number : 000-273
Exam Name : IBM Business Process Manager Advanced V8.0 Integration Development
Vendor Name : IBM
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One examine is not always satisfactory | 000-273 PDF download and test Questions

To enhance yield, best, and value, two separate look at various parameters can also be mixed to check if an element passes or fails.

The consequences gleaned from that approach are extra accurate, allowing test and best engineers to fail materials sooner, discover extra verify escapes, and in the end to Boost yield and in the reduction of manufacturing prices. New information analytic platforms, combined with more desirable utilization of statistically derived values, have made this sort of method simpler to put in force than in the past.

recent development in checking out has been according to a defect-oriented method, which matches past standard checking out which comprises the records sheet. this is especially true for semiconductor devices utilized in protection-critical purposes akin to automotive, medical and aerospace. the use of methods like part general trying out (PAT/DPAT), engineers observe essential records to an electrical check’s value.

but these methods are not any longer ample for finding equipment look at various failures and early life disasters (a.okay.a. latent defects). furthermore, PAT limits nonetheless can fail good constituents.

“Static and dynamic PAT methods aren't delicate ample to decouple ICs with latent defects from natural system variation,” referred to Alex Burlak, vice president of look at various and analytics at proteanTecs. “hence, ICs with latent defects break out production testing and fail over time in the field.”

greater sophisticated statistical strategies study narrowing the inhabitants to believe the usage of a die and its nearest neighbors. however consequences can be superior further if two parametric examine effects are mixed to discover outliers. That comfortably reduces examine escapes and latent defects. additionally, it makes use of present tests which negates the building of a brand new look at various that has to be run in the course of the whole examine application qualification method. together, two look at various values allow a finer discernment between good and bad die/contraptions. To achieve this with ease, engineers want data analytic equipment to aid in deciding on advantageous look at various pair values, recommending move/fail limits, and verifying on a big historical facts for his or her product.

“lots of the frequent facts analytic structures come pre-outfitted with tried-and-genuine outlier detection methods that will also be comfortably applied to any statistics set,” pointed out Mike McIntyre, director of software product management at Onto Innovation. “a number of of the greater sophisticated techniques even allow them for use in quite a few logical (and/or) combos.”

Two exams are stronger than oneCombining two assessments adds value, however it’s non-trivial to enforce. fundamentally, a fine equipment and a foul device display diverse electrical behaviors. The check program includes a collection of exams to take expertise of these transformations. no matter if a huge equipment on a chip (SoC) test with eighty% digital circuitry, or a small RF equipment with trimming and a long listing of analog assessments, the range of parametric verify values purchasable can latitude from tens to heaps.

unhealthy gadgets are due to system excursions, more suitable than anticipated intra-die process mismatch, or defects. In theory, one set of individual exams can realize all failures. That’s commonly no longer the case, although. bad ingredients get neglected at wafer examine and might trigger failures within the box. additionally, stringent pass/fail limits can also fail many good ingredients, which adds to the usual can charge equation.

Combining two verify values can simply tackle these troubles. Engineers discover this strategy extraordinarily useful in fighting box returns, frequently in the range of tens to a whole bunch of ingredients per million. In effect, settling on root trigger for yield improvement is far less vital than discovering a test with a view to detects pesky verify escapes.

however which checks and how do you mix the values? starting two decades ago, engineers regarded to algebraic combos — subtraction and division. These classic measurement suggestions eliminate historical past noise, which is with no trouble the anticipated range of system version accompanied at wafer verify, from wafer to wafer and lot to lot.

The evolution of IDDQ trying out exemplifies the usage of such thoughts. firstly of the millennium, sub-micron CMOS tactics resulted in larger variability in leakage current. Engineers foresaw that IDDQ trying out with characterised limits would now not work. besides the fact that children, for digital circuitry they valued IDDQ’s skill to become aware of defects that escaped ATPG patterns. This induced engineering groups to examine and sooner or later use multiple IDDQ check values to discriminate between first rate and dangerous elements. They subtracted two IDQQ values measured at different voltages. They also used ratios between two IDDQ measurements. therefore, they used two look at various values after one algebraic operation.

With two distinctive analog parameters, reminiscent of gain and DC tiers, or DC levels and background present, they could discover outliers. For some check pair values, a faulty part and a great part will flow every’s determined price. however for some defects, a difference can be found if the two exams have effective correlation relationship. the sort of relationship allows becoming the raw statistics to an equation (e.g., Y = aX+b) using average linear regression techniques.

by way of plotting two particularly correlated values towards one a further, the outliers stick out. If a die/unit is enormously off the road, the engineers have found a test value aggregate that works.

Fig. 1: Bivariate outlier graph and linked wafer map. source: national instruments

Why would two unrelated look at various values observe faulty parts? “if you locate correlations, everybody at all times expects there to be an absolute effortless to keep in mind reason why the correlation exists,” observed Ken Butler, strategic enterprise introduction manager at Advantest america. “We used to try to safeguard why these sets of measurements find this defect. there is loads of semiconductor physics that comes into play. but basically, it may well be any of a couple of issues.”

With a consumer-back part in hand, engineering groups can center of attention on finding a method of detection. Most container returns measure in tens or tons of of materials per million (ppm). settling on a root-cause to increase yield is not a focus enviornment. basically, a two-price based mostly pass/fail determination can also fail some good parts. If it’s not a significant yield loss, an engineer revises the look at various software with the brand new pass/fail limit.

by using taking a two-examine measurement strategy, the new limits exhibit robustness to the ordinary manner variations. Yet from time to time even that isn't decent sufficient. during the last 10 years, some engineers have shifted to the usage of statistical values as an alternative of the measured values, expressing the flow/fail limits when it comes to improved than two regular deviations from the median or mean. That’s greatly distinct that both PAT or DPAT, both of which set a examine value circulate/fail restrict based upon a statistical evaluation.

“some of the least smartly understood features of outlier detection is the way to facts log the results to pressure the optimal and advantageous screening,” said Greg Prewitt, director of Exensio options at PDF solutions. “Most outlier detection mechanisms are statistical in nature, and for this reason an outlier screen is a statistical look at various made in statistical instruments the place the current and voltage aren't any longer germane. The best follow is to data log each and every measurement when it comes to typical deviation of each measurement considered. Then that you could adequately analyze the variety of outlier limits across multiple wafers and a whole lot. This premiere follow become cited by people that traveled the route earlier than me. certainly, I discovered this enlightened strategy to records logging statistical checks from Jeff Roehr at a SEMI cast meeting on outlier detection years in the past.”

Roehr, an IEEE senior member, elaborated extra. “it is somewhat evident that if each wafer were processed as a single entity (lot), and values in terms of RSD (residual ordinary deviation) calculated for each and every information price, then numerous wafers (lots) can be combined the usage of the RSD scale, and the NNR (nearest neighbor residual) method may be used to locate bivariate outliers even in tremendous populations from distinct an awful lot. actually, seriously change the entire records from measured values to RSD adaptations, then do the entire outlier statistics analysis handiest the use of the RSD values.”

Fig. 2: Correlation between two exams the use of Residual common Deviation. source: Jeff Roehr

carefully discerning move vs. failStatistically primarily based look at various limits, be it one, two or extra examine parameters, may still be applied handiest after the efficiency restrict has been met. Focusing just on the statistically derived restrict can lead to look at various escapes.

“the most evident instance is the place the applicable PAT distribution fell inside and outside of a performance spec limit,” said Onto’s McIntyre. “The engineer selected to encompass the materials because they fell inside a PAT distribution ‘limit’ notwithstanding one of the most distribution fell outdoor of a defined performance control restrict.”

accordingly, for analog and mixed signal materials with a high percentage of parametric tests, the look at various application maintains the statistics sheet limit assessments and then applies the outlier limits.

another point of view on determining flow vs. fail may also be considered during the lens of on-die screens, often known as chip telemetry circuits. With tremendous SoCs, this internal information may also be used with wonderful impact to separate passing and failing parts.

“With on-die parametric statistics, outliers can be detected on a customize foundation, no longer population based mostly,” stated proteanTec’s Burlak. “Chip telemetry allows for advanced estimators to be developed early on, permitting for one other dimension to be added to the measurements. Now, check engineers can observe outliers that are reputedly within PAT limits devoid of losing respectable yield, even reclaiming doubtlessly misplaced yield. seeing that it’s precision-primarily based, they get rid of false superb and false bad outliers, and this can be verified. one of the most processes is to run HTOL batches containing detected outliers vs. the average population. The expectation is that the community containing outliers will fail at a greater percentage relative to the baseline.”

Easing the burden with information analytic platformsEngineers all started using bivariate outlier detection innovations 20 years ago. “Going back to about 2005, the theory of outlier turned into obtainable,” noted Roehr. “however industrial application and strategies have been not around. anyone who changed into doing outlier detection methodologies returned then became writing their own code. You had to invent it your self. These information analytic organizations didn’t exist. these days if you want to do it, the utility and tools are actually commercially obtainable. that you can use them to show the crank and as a minimum get an entry stage answer accomplished in a single day — literally.”

After that entry stage answer, engineers need facts analysis means to refine the algorithm parameters and check the impact of these parameters.

“With analytics it is calling at historic records, discovering issues, and trying to understand them, referred to Paul Simon, community director for silicon lifecycle analytics at Synopsys. then you definately implement algorithms to enhance both product fine, yield, or examine time. Now if you happen to enforce an outlier algorithm, it has a definite number of parameters. You need to have the algorithm deployed in such a way that you simply don’t lose too a great deal yield, because there’s a tradeoff with first-rate, and that’s what the product engineers deserve to decide. counting on the product, are they ready to lose 10% of yield to benefit a little little bit of great, or the opposite direction round? in order that requires simulation of very advanced algorithms over ancient statistics, after which tuning these algorithms. you then set up the tuned algorithms on the test floor.”

ConclusionCustomer returns regularly immediate engineering teams to believe bivariate examine limits. The components have handed all of the particular person parametric verify limits. In exploring verify facts values in pairs for a correlated relationship, engineers frequently locate a great discriminator that detects them. Discerning circulate/fail in this method benefits best and yield.

through the use of derived statistical values in place of uncooked examine values engineers enable more desirable robustness of a test flow/limit to normal system variation. This drastically raises as transistor points and metal line widths decrease.

Twenty years in the past, engineering groups wrote custom code for making use of these methods, each statistics analysis and verify software utility. With the appearance of records analytic platforms, engineering groups center of attention on exploring the feasible check combos and on examining the new pass/fail limits. in the end, every now and then two examine values are more advantageous than one.

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